Patent # 4,618,380
Alcorn; George E. (Reston,
VA);
Burgess; Andre S. (Forestville,
MD).
Method of fabricating an imaging X-ray spectrometer
*******Note******* Oct. 21, 1986
Assignee:
The United States of America as represented by the Administrator of the National Aeronautics and Space
Administration (Washington, DC).
